Use of Si strip detectors for low-energy particles in compact geometry

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 515, Issue 3, 2003, Pages 657-664

  Bergmann, U C ^a   Fynbo, H O U ^b   Tengblad, O ^c  

^a CERN   (Switzerland)

^b AARHUS UNIVERSITY   (Denmark)

^c INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

Author keywords

Charged particle spectroscopy; Dead layer effects; Double sided silicon strip detectors; Energy and angle calibration techniques; Large area segmented detectors in close geometry

Indexed keywords

CALIBRATION; CHARGED PARTICLES; PARTICLE DETECTORS; SILICON; SPECTROSCOPIC ANALYSIS; SPURIOUS SIGNAL NOISE;

DEAD-LAYER EFFECTS;

NUCLEAR PHYSICS;

EID: 0242438786     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.07.016     Document Type: Article

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