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Volumn 19, Issue 6, 2003, Pages 1128-1143

Critical values and p values of bessel process distributions: Computation and application to structural break tests

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EID: 0242426476     PISSN: 02664666     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0266466603196107     Document Type: Article
Times cited : (23)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.