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Volumn 2, Issue , 2003, Pages 995-999

Dynamic Behaviour and Ruggedness of Advanced Fast Switching IGBTs and Diodes

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC LOSSES; SWITCHING;

EID: 0242424951     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (7)
  • 1
    • 0002809039 scopus 로고    scopus 로고
    • The Field Stop IGBT (FS-IGBT) - A new Power Device Concept with a Great Improvement Potential
    • T. Laska et al.: "The Field Stop IGBT (FS-IGBT) - A new Power Device Concept with a Great Improvement Potential." Proceedings of the 12th ISPSD, 2000
    • (2000) Proceedings of the 12th ISPSD
    • Laska, T.1
  • 2
    • 0034822511 scopus 로고    scopus 로고
    • Destruction Mechanism of PT and NPT IGBT in the Short Circuit Operation - An Estimation from the Quasi-Stationary Simulations
    • I. Takata: "Destruction Mechanism of PT and NPT IGBT in the Short Circuit Operation - an Estimation from the Quasi-Stationary Simulations." Proceedings of 13th ISPSD, 2001
    • (2001) Proceedings of 13th ISPSD
    • Takata, I.1
  • 3
    • 0041372996 scopus 로고    scopus 로고
    • Investigation on the Short Circuit capability of 1200V Trench Gate Field-Stop IGBTs
    • M. Otsuki et al: "Investigation on the Short Circuit capability of 1200V Trench Gate Field-Stop IGBTs." Proceedings of the 14th ISPSD, 2002
    • (2002) Proceedings of the 14th ISPSD
    • Otsuki, M.1
  • 4
    • 0031634409 scopus 로고    scopus 로고
    • 1200V-Trench-IGBT Study with Square Short Circuit SOA
    • T. Laska et al.: "1200V-Trench-IGBT Study with Square Short Circuit SOA", Proceedings of the 10th ISPSD, pp.433-436, 1998
    • (1998) Proceedings of the 10th ISPSD , pp. 433-436
    • Laska, T.1
  • 5
    • 0242620661 scopus 로고    scopus 로고
    • Rated Overload Characteristics of IGBTs for low voltage and high voltage devices
    • L. Lorenz, A. Mauder, J. G. Bauer: "Rated Overload Characteristics of IGBTs for low voltage and high voltage devices", IEEE Conference Publishing
    • IEEE Conference Publishing
    • Lorenz, L.1    Mauder, A.2    Bauer, J.G.3
  • 6
    • 0012660562 scopus 로고    scopus 로고
    • The Field Stop IGBT Concept with an Optimized Diode
    • T. Laska et al., "The Field Stop IGBT Concept with an Optimized Diode", Proceedings PCIM Nürnberg 2000
    • (2000) Proceedings PCIM Nürnberg
    • Laska, T.1
  • 7
    • 0030082541 scopus 로고    scopus 로고
    • Absolute measurement of carrier concentration and temperature gradients in power semiconductor devices by internal IR-Laser deflection
    • G. Deboy et al.: "Absolute measurement of carrier concentration and temperature gradients in power semiconductor devices by internal IR-Laser deflection", Microelectronic Engineering 31 (1996) pp. 299-307
    • (1996) Microelectronic Engineering , vol.31 , pp. 299-307
    • Deboy, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.