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Volumn 2, Issue , 2003, Pages 995-999
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Dynamic Behaviour and Ruggedness of Advanced Fast Switching IGBTs and Diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
DIODES;
ELECTRIC LOSSES;
SWITCHING;
ELECTRIC STRESS;
INSULATED GATE BIPOLAR TRANSISTORS;
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EID: 0242424951
PISSN: 01972618
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (7)
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