In-situ measurement of space-charge distribution in highly stressed samples

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2003, Pages 257-260

  Didon, N ^a   Agnel, S ^a   Castellon, J ^a   Toureille, A ^a   Matallana, J ^b   Janah, H ^b   Mirebeau, P ^b   Coelho, R ^b   Malrieu, S ^c  

^a UNIV MONTPELLIER   (France)

^b Nexans France   (France)

^c Adv Metrol for Elec Engineering   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC INSULATION; ELECTRIC POTENTIAL; SHORT CIRCUIT CURRENTS; STRESSES;

CURRENT AMPLIFIERS;

ELECTRIC SPACE CHARGE;

EID: 0242424145     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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2. G. Platbrood, G. Geerts, S. Agnel, N. Vella, A. Toureille, REE Special Cables 3, 1998, 57-65
3. S. Agnel, P. Notingher jr., A. Toureille, J. Castellon, S. Malrieu, Proc. CEIDP 1999, 50-53.
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6. P. Llovera Segovia, thèse de Doctorat, Université Paris XI Orsay et Université Polytechnique de Valencia, 2002.
7. A. Toureille, P. Notingher jr., J. Castellon, S. Malrieu, S. Agnel, Polymer Intl. 46(2), 1998, 81-92.
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9. J. Matallana, thèse de Doctorat, Université Montpellier2, 2001.