Accurate Measurements of Valence Electron Distribution and Interfacial Lattice Displacement Using Quantitative Electron Diffraction

Microscopy and Microanalysis

Volumn 9, Issue 5, 2003, Pages 442-456

  Zhu, Yimei ^a   Wu, Lijun ^a   Tafto, J ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

Bi 2Sr2CaCu2O8+ ; Charge density; Charge distribution; Interfacial displacement; MgB2; Quantitative electron diffraction; Superconductors; YBa2Cu3O7

Indexed keywords

EID: 0242339434     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760303037X     Document Type: Article

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