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Volumn 753, Issue , 2003, Pages 463-468

Defects Formation in LaNi5-based Alloys Investigated by In-situ X-ray Diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL DEFECTS; CRYSTAL LATTICES; ISOTHERMS; LATTICE CONSTANTS; X RAY DIFFRACTION;

EID: 0242336584     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (11)
  • 4
    • 0002544147 scopus 로고
    • Rietveld analysis program RIETAN and PREMOS and special applications
    • ed. R. A. Young (Oxford Univ. Press)
    • F. Izumi, "Rietveld analysis program RIETAN and PREMOS and special applications" The Rietveld Method, ed. R. A. Young (Oxford Univ. Press, 1993) pp.236-253.
    • (1993) The Rietveld Method , pp. 236-253
    • Izumi, F.1
  • 6
    • 0242279286 scopus 로고    scopus 로고
    • F. Izumi, http://homepage.mac.com/fujioizumi/
    • Izumi, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.