Detecting elusive surface atoms with atomic force microscopy

Proceedings of the National Academy of Sciences of the United States of America

Volumn 100, Issue 22, 2003, Pages 12531-12532

  Hersam, Mark C ^a   Chung, Yip Wah ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE;

ATOMIC FORCE MICROSCOPY; DIAGNOSTIC IMAGING; ELECTRON TRANSPORT; LOW TEMPERATURE; MOLECULAR INTERACTION; NOTE; OSCILLATION; OSCILLATION RESONANCE FREQUENCY; PHYSICS; PRIORITY JOURNAL; QUANTUM MECHANICS; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY; SIGNAL NOISE RATIO; SURFACE PROPERTY; TOPOGRAPHY;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING TUNNELING; SENSITIVITY AND SPECIFICITY;

EID: 0242331684     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.2335865100     Document Type: Note

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