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Volumn 31, Issue 5 II, 2003, Pages 1100-1102
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Critical analysis of matching schemes in capacitively coupled discharges
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Author keywords
Capacitive coupling; Gas discharges; Plasma impedance; Power matching; Radio frequency (RF) discharges; Sheaths
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Indexed keywords
CAPACITANCE;
CURRENT DENSITY;
ELECTRIC CURRENTS;
ELECTRIC FIELD EFFECTS;
ELECTRIC IMPEDANCE;
INTEGRATED CIRCUIT LAYOUT;
PLASMA SHEATHS;
PLASMAS;
POISSON EQUATION;
POWER INTEGRATED CIRCUITS;
CRITICAL ANALYSIS;
GAS DISCHARGES;
PLASMA IMPEDANCE;
POWER MATCHING;
RADIO FREQUENCY DISCHARGES;
ELECTRIC DISCHARGES;
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EID: 0242323720
PISSN: 00933813
EISSN: None
Source Type: Journal
DOI: 10.1109/TPS.2003.815480 Document Type: Article |
Times cited : (4)
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References (4)
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