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Volumn 767, Issue , 2003, Pages 305-312
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Mechanical Modeling of the 2D Interfacial Slurry Pressure in CMP
a a a b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
FINITE ELEMENT METHOD;
FLOW OF FLUIDS;
INTERFACES (MATERIALS);
PRESSURE MEASUREMENT;
SILICON WAFERS;
SLURRIES;
CONTACT PRESSURE;
CHEMICAL MECHANICAL POLISHING;
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EID: 0242322610
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (11)
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