The fabrication and characterization of polycrystalline CuSn bolometers

Measurement Science and Technology

Volumn 14, Issue 10, 2003, Pages

  Giltrow, M ^a   Boylett, M J ^a   Lawson, N S ^a   Hammiche, A ^a   Griffiths, O J ^a   Wigmore, J K ^a   Efimov, V ^a,b  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

Critical temperature; Cu6Sn5 alloy; Phonons; Superconducting transition temperature; Thin film bolometers; Transition edge sensors

Indexed keywords

BOLOMETERS; COPPER COMPOUNDS; DEPOSITION; EVAPORATION; PHONONS; PHOTONS; SUPERCONDUCTING TRANSITION TEMPERATURE; THIN FILMS; TIN; X RAY DIFFRACTION ANALYSIS;

FILM THICKNESS;

POLYCRYSTALLINE MATERIALS;

BOLOMETRY;

EID: 0242318311     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/14/10/401     Document Type: Article

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