Measurement of the lifetime of the atomic cesium 52D5/2 state with diode-laser excitation

Optics Letters

Volumn 21, Issue 1, 1996, Pages 74-76

  Hoeling, B ^a   Yeh, J R ^a   Takekoshi, T ^a   Knize, R J ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0242312882     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000074     Document Type: Article

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