Recent advances in quantitative convergent beam electron diffraction

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 11-18

  Saunders, Martin ^a   Midgley, Paul ^a   Vincent, Roger ^a   Steeds, John ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

CBED; Low order structure factor refinement; Precession patterns; Structure determination; Zone axis pattern matching

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; SINGLE CRYSTALS; SYSTEMATIC ERRORS;

CONVERGENT BEAM ELECTRON DIFFRACTION; CONVERGENT BEAMS; LOW ORDER; LOW-ORDER STRUCTURE FACTOR REFINEMENT; ORDERING STRUCTURE; PATTERN-MATCHING; PRECESSION PATTERN; STRUCTURE DETERMINATION; STRUCTURE FACTORS; ZONE AXIS; ZONE-AXIS PATTERN MATCHING;

PATTERN MATCHING;

EID: 0242278859     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023405     Document Type: Article

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