A 4H-SiC high-power-density VJFET as controlled current limiter

IEEE Transactions on Industry Applications

Volumn 39, Issue 5, 2003, Pages 1508-1513

  Tournier, Dominique ^a   Godignon, Philippe ^a   Montserrat, Joseph ^a   Planson, Dominique ^b   Raynaud, Christophe ^b   Chante, Jean Pierre ^b   De Palma, Jean Francois ^c   Sarrus, Franck ^d  

^a INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

^b UNIVERSITÉ DE LYON   (France)

^c Ferraz Shawmut Inc   (United States)

^d Ferraz Shawmut ^*  (France)

Author keywords

Command integration; Current limiter; High voltage; JFET; Serial protection device

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC CURRENT CONTROL; ELECTRIC RESISTANCE; FINITE ELEMENT METHOD; GATES (TRANSISTOR); LIMITERS; OPTIMIZATION; SEMICONDUCTOR DIODES; SILICON CARBIDE;

CURRENT-REGULATIVE DIODE; SOFTWARE PACKAGE ISE-TCAD; SPECIFIC ON RESISTANCE;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 0242274179     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIA.2003.816465     Document Type: Article

References (11)

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