Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers

Optics Communications

Volumn 227, Issue 4-6, 2003, Pages 221-225

  Zhang, Chunmin ^a,b   Zhao, Baochang ^b   Xiangli, Bin ^b   Zha, Xinwei ^c  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

^c XI AN UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

Modulation depth; Polarization interference imaging spectrometer; Polarization orientation

Indexed keywords

IMAGING SYSTEMS; LIGHT INTERFERENCE; LIGHT MODULATION; SPECTROMETERS;

MODULATION DEPTH;

LIGHT POLARIZATION;

EID: 0242271270     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.09.050     Document Type: Article

References (8)

1. Persky M.J. Rev. Sci. Instrum. 66:1995;4763.
2. Hammer P.D., Valcro F.P.J., Peterson D.L. Proc. SPIE. 1937:1993;244.
3. Otten L.J., Butler E.W. Proc. SPIE. 2480:1995;418.
4. Padgett M.J., Harvey A.R. Rev. Sci. Instrum. 66:1995;2807.
5. Patterson B.A., Antoni M., Courtial J.et al. Opt. Commun. 130:1996;1.
6. Zhang Chunmin, Xiangli Bin, Zhao BaoChang Opt. Commun. 203(1-2):2002;21.
7. Zhang Chunmin, Xiangli Bin, Zhao BaoChang SPIE. 4087:2000;957.
8. Chunmin Zhang, P.R.C. Patent, 01213109.1, February 2002.