메뉴 건너뛰기




Volumn 83, Issue 14, 2003, Pages 2754-2756

Far-field emission and feedback origin of random lasing in oligothiophene dioxide neat films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EMISSION SPECTROSCOPY; LIGHT EMISSION; LIGHT SCATTERING; PHOTOLUMINESCENCE;

EID: 0142260552     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1616645     Document Type: Article
Times cited : (29)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.