Single electron tunneling and suppression of short-channel effects in submicron silicon transistors

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 5052-5056

  Peters, M G ^a   Den Hartog, S G ^a,d   Dijkhuis, J I ^a   Buyk, O J A ^b   Molenkamp, L W ^c  

^a UTRECHT UNIVERSITY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c RWTH AACHEN UNIVERSITY   (Germany)

^d UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142256482     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368753     Document Type: Article

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