Temperature Dependence of the Refractive Index of Al2O 3-Na2O-SiO2 Melts: Role of Electronic Polarizability of Oxygon Controlled by Network Structure

Metallurgical and Materials Transactions B: Process Metallurgy and Materials Processing Science

Volumn 34, Issue 5, 2003, Pages 549-554

  Yagi, T ^a,b   Susa, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELLIPSOMETRY; POLARIZATION; REFRACTIVE INDEX; THERMAL EFFECTS; THERMAL EXPANSION;

ELECTRONIC POLARIZABILITY;

SLAGS;

EID: 0142231547     PISSN: 10735615     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11663-003-0023-z     Document Type: Conference Paper

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