Probing depth of threshold photoemission electron microscopy

Applied Physics Letters

Volumn 83, Issue 14, 2003, Pages 2925-2927

  Marx, G K L ^a   Jubert, P O ^a   Bischof, A ^a   Allenspach, R ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOEMISSION; PHOTONS; SCANNING ELECTRON MICROSCOPY;

BULK SENSITIVITY;

DIELECTRIC MATERIALS;

EID: 0142229531     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1616651     Document Type: Article

References (21)

1. M. Mundschau, in Handbook of Microscopy, Methods II, edited by S. Amelinckx, D. van Dyck, J. van Landuyt, and G. van Tendeloo (VCH, Weinheim, Germany, 1997).
2. E. Bauer and W. Telieps, in Surface and Interface Characterization by Electron Optical Methods, NATO ASI Series B: Physics Vol. 191, edited by A. Howie and U. Valdre (Plenum, New York, 1988), p. 195.
3. G. K. L. Marx, H.-J. Elmers, and G. Schönhense, Phys. Rev. Lett. 84, 5888 (2000).
4. G. Schönhense, J. Phys.: Condens. Matter 11, 9517 (1999).
5. J. Stöhr, Y. Wu, B. D. Hermsmeier, M. G. Samant, G. R. Harp, S. Koranda, D. Dunham, and B. P. Tonner, Science 259, 658 (1993).
6. F. U. Hillebrecht, T. Kinoshita, D. Spanke, J. Dresselhaus, Ch. Roth, H. B. Rose, and E. Kisker, Phys. Rev. Lett. 75, 2224 (1995).
7. A. Hubert and R. Schäfer, Magnetic Domains (Springer, New York, 1998).
8. K. Koike and K. Hayakawa, Jpn. J. Appl. Phys. 23, L187 (1984).
9. M. R. Scheinfein, J. Unguris, M. H. Kelly, D. T. Pierce, and R. J. Celotta, Rev. Sci. Instrum. 61, 2501 (1990).
10. R. Allenspach, IBM J. Res. Dev. 44, 553 (2000).
11. Handbook of Optical Constants in Solids II, edited by E. D. Palik (Academic, New York, 1991).
12. J. Stöhr, H. A. Padmore, S. Anders, T. Stammler, and M. R. Scheinfein, Surf. Rev. Lett. 5, 1297 (1998).
13. H. C. Siegmann, J. Phys. Condens. Matter 4, 8395 (1992); G. Schönhense and H. C. Siegmann, Ann. Phys. (Leipzig) 2, 465 (1993).
14. H. C. Siegmann, J. Phys. Condens. Matter 4, 8395 (1992); G. Schönhense and H. C. Siegmann, Ann. Phys. (Leipzig) 2, 465 (1993).
15. J. C. Ashley, J. Electron Spectrosc. Relat. Phenom. 50, 323 (1990).
16. H.-J. Drouhin, Phys. Rev. B 62, 556 (2000).
17. R. Nakajima, J. Stöhr, and Y. U. Idzerda, Phys. Rev. B 59, 6421 (1999).
18. M. P. Seah and W. A. Dench, Surf. Interface Anal. 1, 2 (1979).
19. L. Reimer, Scanning Electron Microscopy, Springer Series in Optical Sciences Vol. 45, 2nd ed. (Springer, Berlin, 1998).
20. H. Kanter, Phys. Rev. B 1, 522 (1970).
21. Z. Q. Qiu, J. Pearson, and S. D. Bader, Phys. Rev. B 45, 7211 (1992)