Relationship between root-mean-square and peak-to-peak jitter measurements

Microwave and Optical Technology Letters

Volumn 39, Issue 4, 2003, Pages 323-326

  Babić, Dubravko ^a   Plombon, John ^b  

^a Etanvie Technologies   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Jitter measurement; Random and deterministic jitter

Indexed keywords

CATHODE RAY OSCILLOSCOPES; ELECTRONIC EQUIPMENT TESTING; MATHEMATICAL MODELS; OPTICAL TESTING; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; SIGNAL NOISE MEASUREMENT;

DETERMINISTIC JITTER; JITTER MEASUREMENT; RANDOM JITTER; ROOT MEAN SQUARE;

JITTER;

EID: 0142216641     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.11204     Document Type: Article

References (4)

1. International Committee for Information Technology Standards: INCITS TR-25-1999, Information technology-fibre channel-methodologies for jitter specification (work in progress available at www.t11.org).
2. InfiniBand™ Technical Specification, www.infinibandta.org, vol. 1, 2000.
3. Implementation agreements relating to very short reach inference (VSR) and electrical interfaces, Optical Internetworking Forum, www.oiforum.com, 2001.
4. P.L. Meyer, Introductory probability and statistical applications, Addison-Wesley, Boston, MA, 1970.