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Volumn 467-468, Issue PART II, 2001, Pages 1148-1151
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Rapid X-ray crystal structure analysis in few second measurements using microstrip gas chamber
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0142193306
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)00576-9 Document Type: Article |
Times cited : (7)
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References (11)
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