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Volumn 467-468, Issue PART II, 2001, Pages 1148-1151

Rapid X-ray crystal structure analysis in few second measurements using microstrip gas chamber

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0142193306     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00576-9     Document Type: Article
Times cited : (7)

References (11)
  • 7
    • 21844453017 scopus 로고    scopus 로고
    • Ph.D. Thesis, Tokyo Institute of Technology
    • A. Ochi, Ph.D. Thesis, Tokyo Institute of Technology, 1998.
    • (1998)
    • Ochi, A.1
  • 8
    • 0033347538 scopus 로고    scopus 로고
    • Y. Nishi et al., Proc. SPIE 3774 (1999) 87.
    • (1999) Proc. SPIE , vol.3774 , pp. 87
    • Nishi, Y.1
  • 11
    • 0003610530 scopus 로고    scopus 로고
    • University of Göettingen, Germany
    • G.M. Sheldrick, Technical Report, University of Göettingen, Germany, 1997.
    • (1997) Technical Report
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.