New Process and Pixel Structure of an SOI-CMOS Imager

IEEE International SOI Conference

Volumn , Issue , 2003, Pages 101-102

  Zheng, Xinyu ^a   Seshadri, Suresh ^a   Wood, Michael ^b   Wrigley, Chris ^a   Pain, Bedabrata ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b Naval Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; LEAKAGE CURRENTS; LITHOGRAPHY; PHOTODIODES; QUANTUM EFFICIENCY; SILICON ON INSULATOR TECHNOLOGY;

DARK CURRENTS;

IMAGE SENSORS;

EID: 0142185868     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Ning, T.H., 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, 6-10 Nov 1995 pg 1-4.
2. Fossum, J.G., et.al., IEEE Trans. Electr. Devices, V37-3, Mar 1990, pg 724-9.
3. Inoue, I., et.al., IEEE Trans.Electr. Devices, V50-1, Jan 2003 pg 43-47
4. Zheng, X., et.al., IEEE International SOI Conference 2000, pg 138-9
5. Chen Xu, et.al., IEEE Electr. Device Letters, V225, 2001 pg 248-50