Orientation disorder in ammonium elpasolites: Crystal structures of (NH4)3AlF6, (NH4)3TiOF5 and (NH4)3FeF6

Journal of Fluorine Chemistry

Volumn 124, Issue 1, 2003, Pages 5-15

  Udovenko, A A ^a   Laptash, N M ^a   Maslennikova, I G ^a  

^a INSTITUTE OF CHEMISTRY   (Russian Federation)

Author keywords

Ammonium fluoro elpasolites; Crystal structure; Domains; Entropy; Orientation disorder; Structural phase transitions

Indexed keywords

AMMONIUM DERIVATIVE; FLUORINE; FLUORINE DERIVATIVE; OXYGEN;

ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; ENTROPY; PHASE TRANSITION; PHYSICAL CHEMISTRY; RANDOMIZATION; STATISTICAL ANALYSIS; STRUCTURE ANALYSIS; THERMAL ANALYSIS; X RAY DIFFRACTION;

EID: 0142185105     PISSN: 00221139     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-1139(03)00166-0     Document Type: Article

References (15)

1. Flerov I.N. Gorev M.V. Fiz. Tverd. Tela 43 2001 124-131
2. Flerov I.N. Gorev M.V. Grannec J. Tressaud A. J. Fluorine Chem. 116 2002 9-14
3. Moriya K. Matsuo T. Suga H. Seki S. Bull. Chem. Soc. Jpn. 50 1977 1920-1926
4. Pauling L. J. Am. Chem. Soc. 46 1924 2738-2751
5. Minder W. Z. Kristallogr. 96 1937 15-19
6. Steward E.G. Rooksby H.P. Acta Crystallogr. 6 1953 49-52
7. Massa W. Pausewang G. Mater. Res. Bull. 13 1978 361-368
8. Schmidt R. Pausewang G. Massa W. Z. Anorg. Allg. Chem. 535 1986 135-142
9. Schwarzman S. Z. Kristallogr. 120 1964 286-316
10. Massa W. Babel D. Epple M. Rüdorff W. Rev. Chim. Minér. 23 1986 508-519
11. Flerov I.N. Gorev M.V. Aleksandrov K.S. Tressaud A. Grannec J. Couzi M. Mater. Sci. Eng. R24 1998 81-151
12. I.N. Flerov, V.D. Fokina, A.F. Bovina, N.M. Laptash, Solid State Sci., submitted for publication.
13. Laptash N.M. Maslennikova I.G. Kaidalova T.A. J. Fluorine Chem. 99 1999 133-137
14. Bruker, SMART and SAINT-Plus, Versions 5.0, Data Collection and Processing Software for the Smart System, Bruker AXS Inc., Madison, WI, USA, 1998.
15. G.M. Sheldrick, SHELXTL/PC, Versions 5.0, An Integrated System for Solving, Refining and Displaying Crystal Structures from Diffraction Data, Bruker AXS Inc., Madison, WI, USA, 1998.