Hard X-ray polarimetry with a thick CdTe position sensitive spectrometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4140, Issue 1, 2000, Pages 573-583

  Caroli, E ^a   Bertuccio, G ^b   Cola, A ^a   Curado da Silva, R M ^c   Donati, A ^a   Dusi, W ^a   Landini, G ^a   Siffert, P ^c   Sampietro, M ^b   Stephen, J B ^a  

^a CNR   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c Faculté de Médecine   (France)

Author keywords

CdTe spectrometers; High energy imaging; Monte Carlo simulation; X and gamma ray polarimetry

Indexed keywords

BALLOONS; COMPUTER SIMULATION; COSMIC RAYS; CRYSTALS; GAMMA RAYS; LIGHT POLARIZATION; MONTE CARLO METHODS; OPTICAL TELESCOPES; OPTIMIZATION; SEMICONDUCTING CADMIUM TELLURIDE; X RAY SPECTROMETERS;

POSITION SENSITIVE SPECTROMETERS; X RAY POLARIMETERS;

POLARIMETERS;

EID: 0142181437     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.409157     Document Type: Article

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