A New Surface Parameterization for Modeling Thin Layers of Reflector Material in the DETECT2000 Optical Modeling Program

IEEE Nuclear Science Symposium and Medical Imaging Conference

Volumn 2, Issue , 2002, Pages 846-849

  Thompson, Richard A ^a   Cayouette, Francois ^b   LeBlanc, James ^a   Zelakiewicz, Scott ^a  

^a GE GLOBAL RESEARCH   (United States)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; POLYTETRAFLUOROETHYLENES; SCATTERING; THIN FILMS;

OPTICAL ATTENUATION;

MEDICAL IMAGING;

EID: 0142179121     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)