When good diagnostics go bad - Why maturation is still hard

IEEE Aerospace Conference Proceedings

Volumn 7, Issue , 2003, Pages 3137-3147

  Wilmering, Timothy J ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION DEVELOPMENT; INITIAL SYSTEM DESIGNS; INTEGRATED DIAGNOSTICS; INTEGRATED INFORMATIONS; INTEGRATED VEHICLE HEALTH MANAGEMENTS; OPERATIONAL ENVIRONMENTS; SYSTEM LIFE CYCLE; USAGE ANALYSIS;

CONCEPTUAL DESIGN; KNOWLEDGE REPRESENTATION; LIFE CYCLE;

VEHICLES;

EID: 0142175628     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2003.1234157     Document Type: Conference Paper

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