High performance low noise charge preamplifier with DC coupling to particle silicon detectors in CMOS technology

Electronics Letters

Volumn 34, Issue 13, 1998, Pages 1274-1275

  Hu, Y ^a  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; LEAKAGE CURRENTS; SILICON ON INSULATOR TECHNOLOGY; SILICON SENSORS; SPURIOUS SIGNAL NOISE;

SILICON DETECTORS;

OPERATIONAL AMPLIFIERS;

EID: 0142174709     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19981698     Document Type: Article

References (5)

1. SANSEN, W.M.C., and CHANG, Z.: 'Limits of low noise performance of detector readout front ends in CMOS technology', IEEE Trans. Circuits Syst., 1990, CAS-37, (11), pp. 1375-1382
2. TEDJA, S., VAN DER SPIEGEL, J., and WILLIAMS, H.H.: 'A CMOS low-noise and low-power charge sampling integrated circuit for capacitive detector/sensor interfaces', IEEE J. Solid-State Circuits, 1995, SSC-30, (2), pp. 110-119
3. ANGHINOLFI, F., ASPELL, P., CAMPBELL, M., HEIJNE, E.H., JARRON, P., MEDDELER, G., and SANTIARD, J.C.: 'ICON, a current mode preamplifier in CMOS technology for use with high rate particle detectors', IEEE Trans. Nucl. Sci., 1993, NS-40, (3), pp. 271-274
4. WULLEMAN, J.: 'Current mode charge pulse amplifier in CMOS technology for use with particle detectors', Electron. Lett., 1996, 32, (6), pp. 515-516
5. KRUMMENACHER, F.: 'Pixel detectors with local intelligence: an IC designer point of view', Nucl. Instrum. Methods Phys. Res., 1991, A305, pp. 527-532