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Volumn 36, Issue 9, 1987, Pages 4821-4830
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Temperature dependence of the dielectric function and interband critical points in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0142166825
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.36.4821 Document Type: Article |
Times cited : (765)
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References (67)
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