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Volumn 72, Issue 3, 2003, Pages 217-223
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Optimisation of the epi-ready semi-insulating GaAs wafer preparation procedure
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Author keywords
Epi ready wafers; SI GaAs
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION;
EPITAXIAL GROWTH;
MORPHOLOGY;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
SURFACE QUALITY;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0142154982
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0042-207X(03)00143-X Document Type: Article |
Times cited : (11)
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References (10)
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