|
Volumn 72, Issue 3, 2003, Pages 327-334
|
Comparison of new PEEK® seals with traditional helicoflex for ultra high vacuum applications
|
Author keywords
Engineering polymers; Engineering resins; Helicoflex; PEEK; UHV seals
|
Indexed keywords
GAS CHROMATOGRAPHY;
GASKETS;
GLASS;
MASS SPECTROMETRY;
POLYETHER ETHER KETONES;
RESINS;
ULTRAHIGH VACUUM;
HELICOFLEX;
SEALS;
|
EID: 0142154973
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2003.08.011 Document Type: Article |
Times cited : (23)
|
References (5)
|