|
Volumn , Issue , 2003, Pages 623-628
|
ATE Obsolescence Solutions; Costs and Benefits
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AIRCRAFT;
AUTOMATIC TESTING;
OBSOLESCENCE;
AUTOMATED TEST EQUIPMENT (ATE);
LOGISTICS;
|
EID: 0142153615
PISSN: 07347510
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
|
References (0)
|