Structural characterization of quantum-well layers by double-crystal X-ray diffractometry

Kristallografiya

Volumn 48, Issue 5, 2003, Pages 786-802

  Afanas'ev, A M ^a   Imamov, R M ^a  

^a NONE

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EID: 0142136786     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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