Monte-Carlo simulation of x-ray photoelectron emission from silver

Surface and Interface Analysis

Volumn 35, Issue 10, 2003, Pages 818-823

  Zhang, Zengming ^a   Koshikawa, Takanori ^a   Iyasu, Takeshi ^b   Shimizu, Ryuichi ^b   Goto, Keisuke ^c   Tanaka, Akihiro ^d  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^b OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^d ULVAC PHI Inc   (Japan)

Author keywords

Angular distribution; Depth distribution function; Effective energy loss function; Monte Carlo simulation; REELS analysis; Silver; X ray photoelectron; XPS

Indexed keywords

COMPUTER SIMULATION; ELECTRON ENERGY LOSS SPECTROSCOPY; EMISSION SPECTROSCOPY; MONTE CARLO METHODS; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY LOSS FUNCTION; LANDAU APPROACH; X RAY INCIDENCE ANGLES;

SILVER;

EID: 0142134939     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1609     Document Type: Article

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