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Volumn 75, Issue 26, 1999, Pages 4085-4087

Carbon-related defects in proton-irradiated, n-type epitaxial Si1-xGex

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0142130148     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125544     Document Type: Article
Times cited : (27)

References (26)
  • 1
    • 0031379688 scopus 로고    scopus 로고
    • See, e.g. in Defects and Diffusion in Silicon Processing, edited by, T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty
    • See, e.g., G. D. Watkins, in Defects and Diffusion in Silicon Processing, edited by, T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty, [Mater. Res. Soc. Symp. Proc. 469, 139 (1997)].
    • (1997) Mater. Res. Soc. Symp. Proc. , vol.469 , pp. 139
    • Watkins, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.