Analysis of microstructure and texture of thin films by coupled use of EBSD and other scanning techniques

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 128-129

  Wendrock, H ^a   Menzel, S ^a   Rauser, D ^a   Wetzig, K ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142123930     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603014223     Document Type: Conference Paper

References (3)

1. D.J. Dingley, V. Randle, J.Mat.Sci. 27 (1992), pp. 4546-4566
2. F.J. Humphreys, I. Brough, J. Micr. 195 (1999), pp. 794-809
3. H. Yamashita, Y. Hata, Proc. 22nd ISTFA, Los Angeles, 1996, pp. 89-94