-
1
-
-
0001305590
-
-
(a) Dion, M.; Ganne, M.; Tournoux, M. Mater. Res. Bull. 1981, 16, 1429-1435.
-
(1981)
Mater. Res. Bull.
, vol.16
, pp. 1429-1435
-
-
Dion, M.1
Ganne, M.2
Tournoux, M.3
-
2
-
-
33845378439
-
-
(b) Jacobson, A. J.; Johnson, J. W.; Lewandowski, J. T. Inorg. Chem. 1985, 24, 3727-3729.
-
(1985)
Inorg. Chem.
, vol.24
, pp. 3727-3729
-
-
Jacobson, A.J.1
Johnson, J.W.2
Lewandowski, J.T.3
-
3
-
-
0024019721
-
-
(c) Subramanian, M. A.; Gopalakrishnan, J.; Sleight, A. W. Mater. Res. Bull. 1988, 23, 837-842.
-
(1988)
Mater. Res. Bull.
, vol.23
, pp. 837-842
-
-
Subramanian, M.A.1
Gopalakrishnan, J.2
Sleight, A.W.3
-
4
-
-
0001359592
-
-
(d) Treacy, M. M. J.; Rice, S. B.; Jacobson, A. J.; Lewandowski, J. T. Chem. Mater. 1990, 2, 279-286.
-
(1990)
Chem. Mater.
, vol.2
, pp. 279-286
-
-
Treacy, M.M.J.1
Rice, S.B.2
Jacobson, A.J.3
Lewandowski, J.T.4
-
5
-
-
0000901653
-
-
(a) Ebina, Y.; Tanaka, A.; Kondo, J. N.; Domen, K. Chem. Mater. 1996, 8, 2534-2538.
-
(1996)
Chem. Mater.
, vol.8
, pp. 2534-2538
-
-
Ebina, Y.1
Tanaka, A.2
Kondo, J.N.3
Domen, K.4
-
6
-
-
33745940634
-
-
(b) Yoshimura, J.; Ebina, Y.; Kondo, J.; Domen, K. J. Phys. Chem. 1993, 97, 1970-1973.
-
(1993)
J. Phys. Chem.
, vol.97
, pp. 1970-1973
-
-
Yoshimura, J.1
Ebina, Y.2
Kondo, J.3
Domen, K.4
-
7
-
-
0001215519
-
-
(a) Hardin, S.; Hay, D.; Millikan, M.; Sanders, J. V.; Turney, T. W. Chem. Mater. 1991, 3, 977-983.
-
(1991)
Chem. Mater.
, vol.3
, pp. 977-983
-
-
Hardin, S.1
Hay, D.2
Millikan, M.3
Sanders, J.V.4
Turney, T.W.5
-
9
-
-
0023313838
-
-
(a) Gopalakrishnan, J.; Bhat, V.; Raveau, B. Mater. Res. Bull. 1987, 22, 413-417.
-
(1987)
Mater. Res. Bull.
, vol.22
, pp. 413-417
-
-
Gopalakrishnan, J.1
Bhat, V.2
Raveau, B.3
-
10
-
-
0027544534
-
-
(b) Sato, M.; Abo, J.; Jin, T.; Ohta, M. J. Alloy. Compd. 1993, 192, 81-83.
-
(1993)
J. Alloy. Compd.
, vol.192
, pp. 81-83
-
-
Sato, M.1
Abo, J.2
Jin, T.3
Ohta, M.4
-
11
-
-
0005718014
-
-
Matsuta, T.; Fujita, T.; Miyamae, N.; Takeuchi, M.; Kunou, I. J. Mater. Chem. 1994, 4, 955-958.
-
(1994)
J. Mater. Chem.
, vol.4
, pp. 955-958
-
-
Matsuta, T.1
Fujita, T.2
Miyamae, N.3
Takeuchi, M.4
Kunou, I.5
-
14
-
-
0003025437
-
-
(a) Ikeda, S.; Hara, M.; Kondo, J. N.; Domen, K.; Takahashi, H.; Okubo, T.; Kakihana, M. Chem. Mater. 1998, 10, 72-77.
-
(1998)
Chem. Mater.
, vol.10
, pp. 72-77
-
-
Ikeda, S.1
Hara, M.2
Kondo, J.N.3
Domen, K.4
Takahashi, H.5
Okubo, T.6
Kakihana, M.7
-
15
-
-
0000390086
-
-
(b) Takata, T.; Furumi, Y.; Shinohara, K.; Tanaka, A.; Hara, M.; Kondo, J. N.; Domen, K. Chem. Mater. 1997, 9, 1063-1064.
-
(1997)
Chem. Mater.
, vol.9
, pp. 1063-1064
-
-
Takata, T.1
Furumi, Y.2
Shinohara, K.3
Tanaka, A.4
Hara, M.5
Kondo, J.N.6
Domen, K.7
-
16
-
-
0000334036
-
-
(a) Keller, S. W.; Carlson, V. A.; Stanford, D.; Stenzel, F.; Stacy, A. M.; Kwei, G. H.; Alario-Franco, M. J. Am. Chem. Soc. 1994, 116, 8070-8076.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 8070-8076
-
-
Keller, S.W.1
Carlson, V.A.2
Stanford, D.3
Stenzel, F.4
Stacy, A.M.5
Kwei, G.H.6
Alario-Franco, M.7
-
17
-
-
33751157689
-
-
(b) Stoll, S. L.; Stacy, A. M.; Torardi, C. C. Inorg. Chem. 1994, 33, 2761-2765.
-
(1994)
Inorg. Chem.
, vol.33
, pp. 2761-2765
-
-
Stoll, S.L.1
Stacy, A.M.2
Torardi, C.C.3
-
18
-
-
36449003058
-
-
(c) Sandford, D.; Marquez, L. N.; Stacy, A. M. Appl. Phys. Lett. 1995, 67, 422-423.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 422-423
-
-
Sandford, D.1
Marquez, L.N.2
Stacy, A.M.3
-
19
-
-
0345933520
-
-
(d) Etheredge, K. M. S.; Gardberg, A. S.; Hwu, S.-J. Inorg. Chem. 1996, 35, 6358-6361.
-
(1996)
Inorg. Chem.
, vol.35
, pp. 6358-6361
-
-
Etheredge, K.M.S.1
Gardberg, A.S.2
Hwu, S.-J.3
-
22
-
-
0346834771
-
-
note
-
5(0.133 g), NaOH (2.00 g), and KOH (2.80 g) in a molar ratio 2:1:100:100 was heated (rate = 200°C/h) in a platinum crucible at 450°C for 10 h. Upon cooling at a rate of 70°C/h, 0.573 g of yellowish white powder and rectangular thin plates, in a yield of 95.2% based on La and Gd, were obtained by removing excess flux with water. The identity of bulk products is confirmed by the comparison of experimental XRPD pattern and the calculated pattern based on single-crystal X-ray data.
-
-
-
-
23
-
-
0348095498
-
-
note
-
2 (SHELXL-97).
-
-
-
|