|
Volumn 512, Issue 1-2, 2003, Pages 332-340
|
Evaluation of testing strategies for the radiation tolerant ATLAS n +-in-n pixel sensor
|
Author keywords
ATLAS; Interface damage; Pixel sensor; Quality assurance; Silicon detector
|
Indexed keywords
CHARGED PARTICLES;
RADIATION;
SILICON;
SUBSTRATES;
PIXEL SENSORS;
PARTICLE BEAM TRACKING;
|
EID: 0142095114
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(03)01911-9 Document Type: Conference Paper |
Times cited : (3)
|
References (13)
|