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Volumn 44, Issue 1-3, 1995, Pages 599-606

Instrumentation for high accuracy noise characterisation of front-end devices in detector applications

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0142064141     PISSN: 09205632     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5632(95)80092-1     Document Type: Article
Times cited : (9)

References (9)
  • 4
    • 84914933989 scopus 로고    scopus 로고
    • V. Re, F. Svelto, “High Accuracy Characterisation of Low Frequency Noise of Front-End P-channel Devices for Applications in Elementary Particle and Nuclear Physics”, these Proceedings.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.