Improving the X-ray fluorescence analysis in the SEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 158-159

  Steinbrecher, S ^a   Plies, E ^a  

^a Institut fur Angewandte Physik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142059748     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603016209     Document Type: Conference Paper

References (4)

1. I. Pozsgai, X-Ray Spectrometry 20 (1991) 215.
2. G. Valdrè, X-Ray Spectrometry 22 (1993) 39.
3. www.ixrfsystems.com
4. S. Steinbrecher, this conference.