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Volumn 171, Issue 1-2, 2001, Pages 125-129

Highly resolved electric force microscopy of metal-filled anodic alumina

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY OF SOLIDS; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; SILVER;

EID: 0142049024     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00554-7     Document Type: Article
Times cited : (24)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.