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Volumn 171, Issue 1-2, 2001, Pages 125-129
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Highly resolved electric force microscopy of metal-filled anodic alumina
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC CONDUCTIVITY OF SOLIDS;
IMAGING TECHNIQUES;
NANOSTRUCTURED MATERIALS;
POROUS MATERIALS;
SILVER;
ELECTRIC FORCE MICROSCOPY;
METAL FILLED ANODIC ALUMINA;
ALUMINA;
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EID: 0142049024
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(00)00554-7 Document Type: Article |
Times cited : (24)
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References (12)
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