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Volumn 26, Issue 6, 2003, Pages 585-591

Nanoindentation and AFM studies of PECVD DLC and reactively sputtered Ti containing carbon films

Author keywords

Carbon films; Nanoindentation; Topography

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; FILM PREPARATION; MICROSTRUCTURE; NANOTECHNOLOGY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TRIBOLOGY;

EID: 0142039920     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02704320     Document Type: Article
Times cited : (21)

References (18)
  • 16
    • 0142068380 scopus 로고    scopus 로고
    • Deposition and characterization of PECVD carbon and carbon alloy films in various modification
    • Ph D thesis, Vienna University of Technology, Vienna
    • Schalko J 2001 Deposition and characterization of PECVD carbon and carbon alloy films in various modification, Ph D thesis, Vienna University of Technology, Vienna
    • (2001)
    • Schalko, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.