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Volumn 26, Issue 6, 2003, Pages 585-591
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Nanoindentation and AFM studies of PECVD DLC and reactively sputtered Ti containing carbon films
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Author keywords
Carbon films; Nanoindentation; Topography
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Indexed keywords
AMORPHOUS MATERIALS;
ATOMIC FORCE MICROSCOPY;
COMPOSITION EFFECTS;
FILM PREPARATION;
MICROSTRUCTURE;
NANOTECHNOLOGY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SPUTTER DEPOSITION;
SURFACE TOPOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
TRIBOLOGY;
DIAMOND LIKE CARBON;
NANOINDENTATION;
UNBALANCED MAGNETRON SPUTTER DEPOSITION;
DIAMOND FILMS;
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EID: 0142039920
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02704320 Document Type: Article |
Times cited : (21)
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References (18)
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