Atomic force microscopy silicon tips as photon tunneling sensors: A resonant evanescent coupling experiment

Applied Optics

Volumn 34, Issue 19, 1995, Pages 3737-3742

  Fillard, J P ^a   Castagne, M ^a   Prioleau, C ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PHOTONS; REFRACTIVE INDEX; RESONANT TUNNELING; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON NITRIDE;

ATOMIC FORCE MICROSCOPY TIPS; EVANESCENT COUPLING; FRUSTRATED TOTAL INTERNAL REFLECTIONS; OPTICAL INTERACTIONS; PHOTON SCANNING TUNNELING MICROSCOPY; PHOTON TUNNELING; RESOLUTION LIMITS; TRANSMITTED INTENSITIES;

SEMICONDUCTING SILICON;

EID: 0142011415     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.003737     Document Type: Article

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