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Volumn 15, Issue 38, 2003, Pages 6485-6492
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A ballistic electron emission microscopy study of ferromagnetic thin films embedded in Au/GaAs(100)
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON EMISSION;
ELECTRON TRANSPORT PROPERTIES;
EMISSION SPECTROSCOPY;
GOLD;
INTERFACES (MATERIALS);
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR METAL BOUNDARIES;
SUBSTRATES;
THICKNESS MEASUREMENT;
BALLISTIC ELECTRON EMISSION MICROSCOPY;
FERROMAGNETIC THIN FILMS;
METAL METAL INTERFACES;
FERROMAGNETIC MATERIALS;
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EID: 0142008293
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/15/38/016 Document Type: Article |
Times cited : (3)
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References (22)
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