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Volumn 91, Issue 8, 2003, Pages 870011-870014

Magnetic Penetration Depth Measurements of Pr2-xCe xCuO4-δs Films on Buffered Substrates: Evidence for a Nodeless Gap

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); FILM GROWTH; LOW TEMPERATURE EFFECTS; SEMICONDUCTING FILMS;

EID: 0141991882     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (60)

References (24)
  • 7
    • 0000440008 scopus 로고    scopus 로고
    • L. Alff et al., Phys. Rev. B 58, 11197 (1998).
    • (1998) Phys. Rev. B , vol.58 , pp. 11197
    • Alff, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.