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Volumn 91, Issue 8, 2003, Pages 870011-870014
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Magnetic Penetration Depth Measurements of Pr2-xCe xCuO4-δs Films on Buffered Substrates: Evidence for a Nodeless Gap
a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
DOPING (ADDITIVES);
FILM GROWTH;
LOW TEMPERATURE EFFECTS;
SEMICONDUCTING FILMS;
NODELESS GAPS;
PRASEODYMIUM COMPOUNDS;
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EID: 0141991882
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (60)
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References (24)
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