Optimization of EDX performance in Tecnai TEMs

Micron

Volumn 34, Issue 3-5, 2003, Pages 185-188

  Von Harracha, H S ^a   Freitag, B ^a   Gerits, W ^a   Sandborg, A ^b  

^a Thermo Fisher Scientific   (United States)

^b EDAX Mahwah   (United States)

Author keywords

EDX; FEG TEM; Peak background ratio; Spurious peaks

Indexed keywords

EID: 0141975749     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(03)00029-5     Document Type: Conference Paper

References (7)

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