XPS analysis of light elements (C, N) remaining in sol-gel derived TiO2 films

Journal of Materials Science Letters

Volumn 22, Issue 18, 2003, Pages 1255-1258

  Shi, Z M ^a   Ye, X Y ^b   Liang, K M ^b   Gu, S R ^b   Pan, F ^b  

^a Inner Mongolia Polytechnic University   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION REACTIONS; ADSORPTION; AMINES; CARBON; CERIUM; CERIUM COMPOUNDS; ELECTRON ENERGY LEVELS; NITROGEN; SOL-GELS; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CERIUM NITRATE; DIETHANOLAMINE; PHYSICOCHEMICAL PROPERTY; TITANIUM DIOXIDE FILM; TITANIUM TETRAISOPROPOXIDE;

TITANIUM DIOXIDE;

EID: 0141975200     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1025402017295     Document Type: Article

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