Scaled model measurement of the embedding impedance of a 660-GHz waveguide SIS mixer with a 3-standard deembedding method

IEEE Microwave and Wireless Components Letters

Volumn 13, Issue 9, 2003, Pages 376-378

  Zhang, W ^a   Tong, C Y Edward ^b   Shi, S C ^a  

^a CHINESE ACADEMY OF SCIENCES   (China)

^b HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

Deembedding method; Embedding impedance; Scaled model; SIS mixer; Time domain gating

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; EMBEDDED SYSTEMS; SEMICONDUCTOR DEVICE MODELS; SHORT CIRCUIT CURRENTS; SUPERCONDUCTING DEVICES; TIME DOMAIN ANALYSIS; WAVEGUIDES;

DEEMBEDDING METHOD; EMBEDDING IMPEDANCE; OPEN CIRCUIT; SCALED MODEL MEASUREMENT; SUPERCONDUCTOR INSULATOR SUPERCONDUCTOR MIXER;

MIXER CIRCUITS;

EID: 0141954023     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2003.817112     Document Type: Letter

References (10)

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