Metrological justification of reflection hologram interferometry with respect to residual stresses determination by means of blind hole drilling

Optics and Lasers in Engineering

Volumn 41, Issue 2, 2004, Pages 353-410

  Pisarev, V S ^a   Aistov, V S ^a   Balalov, V V ^a   Bondarenko, M M ^a   Chumak, S V ^a   Grigoriev, V D ^a   Yustus, M G ^a  

^a CENTRAL AEROHYDRODYNAMIC INSTITUTE TSAGI   (Russian Federation)

Author keywords

Actual and reference fringe patterns; Blind hole drilling; Reflection hologram interferometry; Transition model choice and verification; Uniform and non uniform residual stress field

Indexed keywords

ALUMINUM; INTERFEROMETRY; LIGHT REFLECTION; RESIDUAL STRESSES;

FRINGE PATTERNS;

HOLOGRAMS;

EID: 0141929588     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00212-9     Document Type: Article

References (5)

1. Pisarev V.S., Balalov V.V., Aistov V.S., Bondarenko M.M., Yustus M.G. Reflection hologram interferometry combined with hole drilling technique as an effective tool for residual stresses fields investigation in thin-walled structures. Opt Lasers Eng. 36(6):2001;551-597.
2. Shchepinov V.P., Pisarev V.S. Strain and stress analysis by holographic and speckle interferometry. 1996;Wiley, Chichester.
3. Pisarev VS, Dzuba AS, Grigoriev VD, Chumak SV. Reference fringe patterns as effective tool for local strain analysis based on holographic interferometry data. In: Juptner W, Osten W, editors. Fringe 2001. Proceeding of the Fourth International Workshop on Automatic Processing of Fringe Patterns. Paris: Elsevier, 2001. p. 475-88.
4. Pisarev VS, Grigoriev VD, Dzuba AS, Lobanov LM, Pivtorak VA. Holographic interferometry combined with hole drilling technique as the least destructive mechanical method for residual stresses determination. Proceedings of International Conference on Trends in Optical Non-destructive Testing. Lugano, 2000. p. 77-86.
5. Maclead N., Kapur D.N. A kinematically designed mount for the precise location of specimens for holographic interferometry. J Phys E: Sci Instrum. 6:1973;423-424.