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Volumn 175, Issue 2, 2003, Pages 264-271

Synthesis, characterization and dielectric properties of new unidimensional quaternary tellurites: LaTeNbO6, La4Te 6Nb2O23, and La4Te 6Ta2O23

Author keywords

Dielectric properties; One dimensional; Oxides; Tellurites; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

EID: 0141922854     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4596(03)00260-3     Document Type: Article
Times cited : (24)

References (19)
  • 9
    • 0004009842 scopus 로고
    • Siemens Analytical X-ray Instruments, Inc., Madison, WI
    • SAINT, Version 4.05, Siemens Analytical X-ray Instruments, Inc., Madison, WI, 1995.
    • (1995) SAINT, Version 4.05


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.