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Volumn 175, Issue 2, 2003, Pages 310-315

Ga-Ga bonding and tunnel framework in the new Zintl phase Ba 3Ga4Sb5

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL STRUCTURE; CRYSTALLIZATION; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

EID: 0141922851     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4596(03)00293-7     Document Type: Article
Times cited : (21)

References (20)
  • 20
    • 85031056398 scopus 로고    scopus 로고
    • SMART, Siemens Analytical X-ray Systems, Inc., Madison, WI, 1994; SAINT, Siemens Analytical X-Ray Systems, Inc., Madison, WI, 1995.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.