Analysis of an internal crack of pressure pipeline using ESPI and shearography

Optics and Laser Technology

Volumn 35, Issue 8, 2003, Pages 639-643

  Kim, Kyung Suk ^a   Kang, Ki Soo ^a   Kang, Young June ^b   Cheong, Seong Kyun ^c  

^a Chosun University   (South Korea)

^b Chonbuk National University   (South Korea)

^c Seoul National University of Science and Technology   (South Korea)

Author keywords

Electronic speckle pattern interferometry (ESPI); Quantitative analysis; Shearography

Indexed keywords

CRACKS; DIFFERENTIATION (CALCULUS); INTERFEROMETRY; PIPELINES; PRESSURIZATION;

SHEAROGRAPHY;

SPECKLE;

EID: 0141921696     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(03)00111-7     Document Type: Article

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